Timing-aware ATPG for high quality at-speed testing of small delay defects

Proceedings of the Asian Test Symposium

Volumn 2006, Issue , 2006, Pages 139-146

  Lin, Xijiang ^a   Tsai, Kun Han ^a   Wang, Chen ^a   Kassab, Mark ^a   Rajski, Janusz ^a   Kobayashi, Takeo ^a   Klingenberg, Randy ^a   Sato, Yasuo ^b   Hamada, Shuji ^b   Aikyo, Takashi ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b Academic Research Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEFECTS; ERROR ANALYSIS; FAULT DETECTION; PRODUCT DESIGN;

DELAY DETECTS; FAULT SIMULATION; STANDARD DELAY FORMAT (SDF);

ELECTRONIC EQUIPMENT TESTING;

EID: 33947642638     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2006.261012     Document Type: Conference Paper

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