Delay defect screening using process monitor structures

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 43-48

  Mitra, Subhasish ^a,b   Volkerink, Erik ^b   McCluskey, Edward J ^b   Eichenberger, Stefan ^c  

^a INTEL CORPORATION   (United States)

^b Stanford University   (United States)

^c NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TESTING; PROCESS MONITORING; RING OSCILLATORS; STANDARD DEVIATION;

DEFECTS; DELAY CIRCUITS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; MONITORING; PROCESS CONTROL; REGRESSION ANALYSIS;

ELECTRON DEVICE TESTING;

EID: 3142720622     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299224     Document Type: Conference Paper

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