Surface stress effects on the resonant properties of silicon nanowires

Journal of Applied Physics

Volumn 103, Issue 12, 2008, Pages

  Park, Harold S ^a  

^a UCB 450   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; BOUNDARY CONDITIONS; BOUNDARY VALUE PROBLEMS; CONTINUUM MECHANICS; DIMENSIONAL STABILITY; EIGENVALUES AND EIGENFUNCTIONS; ELASTICITY; ELECTRIC WIRE; FINITE ELEMENT METHOD; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; NATURAL FREQUENCIES; PHOTOACOUSTIC EFFECT; SILICON; STANDARDS; STRESSES;

(1 1 0) SURFACE; (I ,J) CONDITIONS; (PL) PROPERTIES; AMERICAN INSTITUTE OF PHYSICS (AIP); BEAM THEORIES; CAUCHY-BORN; COUPLED EFFECTS; EIGENVALUE PROBLEM (EVP); FINITE DEFORMATIONS; KEY PARAMETERS; MECHANICS MODELS; NANO WIRES; RESONANT FREQUENCIES; SILICON NANOWIRES (SINWS); STANDARD FINITE ELEMENT; SURFACE AREA-TO-VOLUME RATIOS; SURFACE STRESS EFFECTS; SURFACE STRESSES;

SURFACE PROPERTIES;

EID: 46449126833     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2939576     Document Type: Article

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