Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: Rectangular plates

Journal of Applied Physics

Volumn 89, Issue 5, 2001, Pages 2911-2921

  Sader, John Elie ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005912693     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1342018     Document Type: Article

References (30)

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26. Maximum deflections exhibited in practice are typically far smaller than the thickness of the plate.
27. From Saint Venant's principle, a thin boundary layer is expected at the clamped end x = 0 for L/b≫1. Such an expansion will enable the modeling of this boundary layer.
28. From Saint Venant's principle, thin boundary layers are expected at the tree ends y = ±b/2 for L/b≪1. Such a power series will enable the modeling of these boundary layers.
29. LUSAS is a trademark of, and is available from FEA Ltd. Forge House, 66 High St., Kingston Upon Thames, Surrey KT1 1HN, UK. Quadrilateral thin plate elements with linear interpolation were used throughout.
30. End-tip displacements can be measured with a scanning tunneling microscope tip, whereas the slope can be measured using the optical deflection technique.