A nanometre-scale mechanical electrometer

Nature

Volumn 392, Issue 6672, 1998, Pages 160-162

  Cleland, A N ^a,b   Roukes, M L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DEVICE; ELECTRIC FIELD; ELECTRODE; FORCE; MAGNETIC FIELD; MOTION; PRIORITY JOURNAL; SEMICONDUCTOR; TEMPERATURE;

EID: 0032510577     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/32373     Document Type: Article

References (13)

1. Coulomb, C. A. Memoires de l'Academie Royale des Sciences 229-236 (Academie royale des sciences, Paris, 1784).
2. Zimmerli, G., Eiles, T. M., Kautz, R. L. & Martinis, J. M. Noise in the Coulomb blockade electrometer. Appl. Phys. Lett. 61, 237-239 (1992).
3. Cleland, A. N. & Roukes, M. L. Fabrication of high frequency nanometer scale mechanical resonators from bulk Si crystals. Appl. Phys. Lett. 69, 2653-2655 (1996).
4. Albrecht, T. R., Grutter, P., Home, D. & Rugar, D. Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 69, 668-673 (1991).
5. Robins, W. P. Phase Noise in Signal Sources: Theory and Applications (Pertgrinus, London, 1984).
6. Greywall, D. S., Yurke, B., Busch, P. A., Pargellis, A., N., & Willett, R. L. Evading amplifier noise in nonlinear oscillators. Phys. Rev. Lett. 72, 2992-2995 (1994).
7. Yurke, B., Greywall, D. S., Pargellis, A. N. & Busch, P. A. Theory of amplifier noise evasion in an oscillator employing a nonlinear resonator. Phys. Rev. A 51, 4211-4229 (1995).
8. Bordoni, F., Maggi, G., Ottaviano, A. & Pallotino, G. V. Very low noise cooled audiofrequency preamplifier for gravitational research. Rev. Sci. Instrum. 52, 1079-1086 (1981).
9. Stern, I. E., Terris, B. D., Mamin, H. J. & Rugar, D. Deposition and imaging of localized charge in insulator surfaces using a force microscope. Appl Phys .Lett. 53, 2717-2719 (1988).
10. Schonenberger, C. & Alvarado, S. F. Observation of single charge carriers by force microscopy, Phys. Rev. Lett. 65, 3162-3164 (1990).
11. Pendry, J. B., Kirkman, P. D. & Castano, E. Electrons at disordered surfaces and l/f noise. Phys. Rev. Lett. 57, 2983-2986 (1986).
12. Cleland, A. N., Esteve, D., Urbina, C. & Devoret, M. H. Very low noise photoedector based on the single electron transistor. Appl. Phys. Lett. 61, 2820-2822 (1992).
13. Yoo, M. J. et al. Scanning single-electron transistor microscopy: Imaging individual charges. Science 276, 579-582 (1997).