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Volumn 69, Issue 16, 2004, Pages

Interpretation of ion-channeling spectra in ion-implanted Si with models of structurally relaxed point defects and clusters

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 45849155088     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.165216     Document Type: Article
Times cited : (10)

References (33)
  • 22
    • 33646659630 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Bologna, Bologna, Italy
    • S. Balboni, Ph.D. thesis, University of Bologna, Bologna, Italy, 2002.
    • (2002)
    • Balboni, S.1
  • 29
    • 33646665948 scopus 로고    scopus 로고
    • These calculations were performed using the plane-wave self-consistent-field PWSCF code: http://www.pwscf.org


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.