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Volumn 49, Issue 2, 2000, Pages 259-266

Fluctuation microscopy: A probe of atomic correlations in disordered materials

Author keywords

Amorphous semiconductors; Disordered materials; Fluctuation microscopy; Medium range order; Quantitative microscopy

Indexed keywords

MAGNETIC MATERIALS;

EID: 0034101356     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023805     Document Type: Article
Times cited : (106)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.