Fluctuation microscopy: A probe of atomic correlations in disordered materials

Journal of Electron Microscopy

Volumn 49, Issue 2, 2000, Pages 259-266

  Voyles, P M ^a,b   Gibson, J M ^c   Treacy, M M J ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b NEC LABORATORIES AMERICA   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Amorphous semiconductors; Disordered materials; Fluctuation microscopy; Medium range order; Quantitative microscopy

Indexed keywords

MAGNETIC MATERIALS;

AMORPHOUS SEMICONDUTTOR; ATOMIC CORRELATION; DARK-FIELD; DISORDERED MATERIALS; FLUCTUATION MICROSCOPY; FLUTTUATION MICROSCOPY; LOWER RESOLUTION; MEDIUM RANGE; MEDIUM RANGE ORDER; QUANTITATIVE MICROSCOPY;

AMORPHOUS MATERIALS;

EID: 0034101356     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023805     Document Type: Article

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