Automated PICA transistor channeling and spatial-temporal photon correlation for faster IC diagnosis

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 545-552

  Desplats, Romain ^a   Beaudoin, Felix ^a   Faggion, Gaël ^a   Jesson, Olivier ^a   Perdu, Philippe ^a   Leibowitz, Marty ^b   Lundquist, Ted ^b   Shah, Ketan ^b  

^a CNES   (France)

^b NPTest   (United States)

Author keywords

Failure analysis; IC debug; Photon correlation; PICA

Indexed keywords

COMPUTER DEBUGGING; IMAGING SYSTEMS; LIGHT EMISSION; PHOTONS; TRANSISTORS;

PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA);

INTEGRATED CIRCUITS;

EID: 0037972609     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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