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Volumn 266, Issue 12-13, 2008, Pages 2766-2771

Irradiation effects induced in silicon carbide by low and high energy ions

Author keywords

Ion radiation effects; Radiation damage (amorphization); Recrystallization; Silicon carbide

Indexed keywords

AMORPHIZATION; ION BOMBARDMENT; MOLECULAR DYNAMICS; MOLECULAR MODELING; RADIATION DAMAGE; RECRYSTALLIZATION (METALLURGY);

EID: 44649151064     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.113     Document Type: Article
Times cited : (32)

References (58)
  • 35
    • 44649189337 scopus 로고    scopus 로고
    • See, for example, The Proceedings of the Swift Heavy Ions in Materials (SHIM) Conferences.
    • See, for example, The Proceedings of the Swift Heavy Ions in Materials (SHIM) Conferences.
  • 40
    • 44649146029 scopus 로고    scopus 로고
    • M.W. Chase Jr., NIST-JANAF Thermochemical Tables, fourth ed., J. Phys. Chem. Ref. Data Monograph 9 (1999) 1.
    • M.W. Chase Jr., NIST-JANAF Thermochemical Tables, fourth ed., J. Phys. Chem. Ref. Data Monograph 9 (1999) 1.
  • 45
    • 0004013464 scopus 로고
    • Cambridge University Press, Cambridge
    • Haasen P. Physical Metallurgy (1978), Cambridge University Press, Cambridge
    • (1978) Physical Metallurgy
    • Haasen, P.1
  • 53
    • 44649170547 scopus 로고    scopus 로고
    • note
    • This assumption is based on the fact that amorphous solids generally exhibit similar specific heat capacities as their crystalline counterparts (see, for example, [52]), except at very low temperature.
  • 54
    • 44649091453 scopus 로고    scopus 로고
    • note
    • The electron mean free path λ is expected to be shorter in the amorphous phase than in the crystalline one. This will give rise to higher temperatures than those attained by taking for amorphous SiC a similar λ as for crystalline SiC. Such an effect is well illustrated in Fig. 2 which compares the temperature at a radial distance of 3 nm for λ = 5.5 and 4.5 nm. Therefore, due to the lack of actual data, assuming for amorphous SiC the same electron mean free path as for crystalline SiC can be considered as a low limiting case for the model.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.