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Volumn 516, Issue 18, 2008, Pages 6483-6486
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Reactive sputtering of Al2O3 on AlGaN/GaN heterostructure field-effect transistor
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Author keywords
Aluminum oxide; Chemical vapor deposition; Epitaxy; Gallium nitride
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Indexed keywords
ALUMINUM COMPOUNDS;
CHEMICAL VAPOR DEPOSITION;
EPITAXIAL GROWTH;
GALLIUM NITRIDE;
HETEROJUNCTIONS;
REACTIVE SPUTTERING;
ALUMINUM OXIDE;
GATE LEAKAGE;
LEAKAGE CURRENT DENSITY;
FIELD EFFECT TRANSISTORS;
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EID: 44649100334
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.02.039 Document Type: Article |
Times cited : (7)
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References (18)
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