Analysis of microwave noise sources in 150 GHz SiGe HBTs

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

Volumn , Issue , 2004, Pages 291-294

  Sakalas, P ^a,b   Schroter M ^a   Scholz, R F ^c   Jiang, H ^d   Racanelli, M ^d  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^c IHP   (Germany)

^d Jazz Semiconductor   (United States)

Author keywords

HBT; HICUM; Noise parameters; Shot noise

Indexed keywords

BICMOS; HICUM; NOISE PARAMETERS;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CORRELATION METHODS; CURRENT DENSITY; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MICROWAVES; SEMICONDUCTING SILICON COMPOUNDS; SHOT NOISE; THERMODYNAMICS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 4444351638     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)

1. J.S.Rieh et al., IEDM Tech. Digest, pp. 771-774, 2002.
2. M. Racanelli et al., IEDM Tech. Digest, CDr, 2001.
3. K. Schuhgraf et al., Proc. BCTM, pp. 147-150, 2001.
4. D.R.Greenberg et al., IEDM Tech. Digest, pp. 787-790, 2002.
5. L.Escotte et al., IEEE Trans. ED, Vol.42, pp. 883-888, 1995.
6. J.Möller et al., Proc. IEEE BCTM, pp. 228-231, 2002.
7. F.Herzel, Mater. & Se. Semicond. Process., 6, pp. 119-127, 2003.
8. G.Niu et al., IEEE Trans. ED, Vol.48, No.11, pp. 2568-2574, 2001.
9. Y.Cui et al., Proc. IEEE BCTM, pp. 225-228, 2003.
10. C.Jungemann et al., Proc. 17th Int. Conf. ICNF, pp. 671-674, 2003.
11. S.P.Voinigescu et al., IEEE J. S-SC, Vol.32, pp. 1430-1439, 1997.
12. F.Herzel et al., Intern.Journ.Electronics 81, pp.37-48, 1996.
13. C.Jungemann et al., Proc. SPIE Conf. "Noise in Devices and Circuits), 2004.
14. A.Van Der Ziel, Fluctuation Phen. in Sem., Butterworths Scient. pub., 1959.
15. M. Schroter, IEEE Circuits & Devices Mag., Vol.18, pp. 16-25, 2002.
16. M.Rudolph et al., IEEE EDL, vol.20, NO.1, 1999.
17. P.Sakalas et al., IEEE MTT-S IMS. Dig., Vol.3, pp. 2117-2120, 2002.
18. P.Sakalas.et al., Proc. SPIE Conf. "Noise in Devices and Circuits), 2004
19. M.C.A.M.Koolen et al., Proc. IEEE BCTM, pp. 188-191, 1991.
20. F.Sischka, Agilent Modeling Toolkits, 4 Verify.doc, www.agilent.com
21. M.M.Jahan et al., IEEE EDL, Vol.16, No.12, 1995.
22. Z.Yan and M. Schroter, Rockwell Inc., Internal Report, 1998.