An improved model for high-frequency noise in BJTs and HBTs interpolating between the quasi-thermal approach and the correlated-shot-noise model

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 2002, Pages 228-231

  Möller, Jesco ^a   Heinemann, Bernd ^a   Herzel, Frank ^a  

^a IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; HETEROJUNCTION BIPOLAR TRANSISTORS; LEAST SQUARES APPROXIMATIONS; SEMICONDUCTOR DOPING; THERMODYNAMICS;

HIGH-FREQUENCY NOISE;

CMOS INTEGRATED CIRCUITS;

EID: 0036442259     PISSN: 10889299     EISSN: None     Source Type: Journal    
DOI: 10.1109/BIPOL.2002.1042924     Document Type: Article

References (10)

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