메뉴 건너뛰기




Volumn 3, Issue , 2002, Pages 2117-2120

Microwave noise sources in AlGaAs/GaAs HBTs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SCATTERING PARAMETERS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SPURIOUS SIGNAL NOISE;

EID: 0036069629     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1012288     Document Type: Article
Times cited : (7)

References (14)
  • 1
    • 85013596269 scopus 로고
    • Microwave noise performance of In/InGaAs HBTs
    • (1989) IEEE EDL , vol.10 , Issue.10
    • Chen, Y.-K.1
  • 2
    • 0005678806 scopus 로고
    • DC, RF and noise characteristics of carbon-doped base InP/InGaAs HBTs
    • (1994) IEEE ED , vol.41 , Issue.1
    • Hong, B.W.-P.1
  • 3
    • 0029408179 scopus 로고
    • High-frequency noise of bipolar devices in consideration of carrier heating and low temperature effects
    • (1995) Solid-State Electronics , vol.38 , Issue.11
    • Herzel, F.1
  • 6
    • 0005773516 scopus 로고
    • Junction temperature dependence of high-frequency noise in HBTs
    • (1995) IEEE EDL , vol.16 , Issue.12
    • Jahan, M.M.1
  • 7
    • 0001163697 scopus 로고
    • Small-signal and noise model extraction technique for HBTs at microwave frequencies
    • (1995) IEEE MTT , vol.43 , Issue.2
    • Roux, J.P.1
  • 8
    • 0029751449 scopus 로고    scopus 로고
    • Bias, frequency, and area dependencies of high frequency noise in AlGaAs/GaAs HBT’s
    • (1996) IEEE ED , vol.43 , Issue.1
    • Liou, J.J.1
  • 10
  • 12
    • 85013601329 scopus 로고
    • Direct extraction of the AlGaAs/GaAs HBT small-signal equivalent circuit
    • (1991) IEEE ED , vol.38 , Issue.9
    • Costa, D.1
  • 13
    • 0032049266 scopus 로고    scopus 로고
    • Microwave low-noise AlGaAs/InGaAs HBT’s with p+-regrown base contacts
    • (1998) IEEE EDL , vol.19 , Issue.4
    • Dodo, H.1
  • 14
    • 0035506234 scopus 로고    scopus 로고
    • A unified approach to RF and microwave noise parameter modeling in bipolar transistors
    • (2001) IEEE ED , vol.48 , Issue.11 , pp. 2568-2574
    • Niu, G.1    Cressler, J.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.