High-frequency noise in SiGe HBTs

Materials Science in Semiconductor Processing

Volumn 6, Issue 1-3, 2003, Pages 119-127

  Herzel, Frank ^a  

^a IHP   (Germany)

Author keywords

Device simulation; High frequency noise; Microwave noise; Noise modeling; SiGe HBT; Small signal analysis

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

SMALL-SIGNAL ANALYSIS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0142229635     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(03)00078-7     Document Type: Review

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