On path-based learning and its applications in delay test and diagnosis

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 492-497

  Wang, Li C ^a   Mak, T M ^b   Cheng, Kwang Ting ^a   Abadir, Magdy S ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INTEL CORPORATION   (United States)

^c MOTOROLA INC   (United States)

Author keywords

Delay test; Machine learning; Statistical timing simulation

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; CROSSTALK; DELAY CIRCUITS; PROBLEM SOLVING; SET THEORY;

DELAY TEST; PATH-BASED LEARNING; PERFORMANCE ANALYSIS; STATISTICAL TIMING SIMULATION;

LEARNING SYSTEMS;

EID: 4444301681     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996704     Document Type: Conference Paper

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