SCOPUS 정보 검색 플랫폼

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 1, Issue , 2004, Pages 692-693

Regression simulation: Applying path-based learning in delay test and post-silicon validation

(1) Wang, Li C a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY TESTS; PATH-BASED LEARNING; POST-SILICON VALIDATION; REGRESSION SIMULATION; CRITICAL PATHS; MACHINE LEARNERS; POST-SILICON; POST-SILICON VALIDATIONS; STATISTICAL TIMING; TIMING SIMULATORS;

APPROXIMATION THEORY; COMPUTER SIMULATION; DELAY CIRCUITS; FUNCTION EVALUATION; REGRESSION ANALYSIS; SEMICONDUCTING SILICON; EXHIBITIONS; MACHINE COMPONENTS; SILICON;

LEARNING SYSTEMS; REGRESSION ANALYSIS;

EID: 3042651370 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/DATE.2004.1268934 Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.