Quantitative characterization of crosstalk effects for friction force microscopy with scan-by-probe SPMs

Ultramicroscopy

Volumn 108, Issue 7, 2008, Pages 642-645

  Prunici, Pavel ^a   Hess, Peter ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Crosstalk; FFM; Scan by probe AFM

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CANTILEVER BEAMS; CROSSTALK; FRICTION;

CANTILEVER PROPERTIES; FRICTION FORCE MICROSCOPY;

PHOTODETECTORS;

ARTICLE; ATOMIC FORCE MICROSCOPE; ATOMIC FORCE MICROSCOPY; CALIBRATION; FRICTION FORCE MICROSCOPY; MICROSCOPE; MICROSCOPY;

EID: 44149103384     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.10.001     Document Type: Article

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