Cross talk between friction and height signals in atomic force microscopy

Review of Scientific Instruments

Volumn 73, Issue 9, 2002, Pages 3392-

  Piner, Richard ^a   Ruoff, Rodney S ^a  

^a Northwestern University   (United States)

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Indexed keywords

EID: 18544377019     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499539     Document Type: Article

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