Local capacitance measurements on InAs dot-covered GaAs surfaces by scanning capacitance microscopy

Applied Physics Letters

Volumn 77, Issue 13, 2000, Pages 1994-1996

  Yamamoto, H ^a   Takahashi, T ^a   Kamiya, I ^b,c  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000596627     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1312257     Document Type: Article

References (13)

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