메뉴 건너뛰기




Volumn 13, Issue 4, 2004, Pages 451-460

Atomic force microscopy study of biaxiaily oriented polypropylene films

Author keywords

AFM tip effect; Atomic force microscopy (AFM); Biaxialiy oriented polypropylene (BOPP); Check tip performance using BOPP; Surface morphology; UV ozone treatment

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTAMINATION; MORPHOLOGY; OZONIZATION; PLASTIC FILMS; POLYMERS; SURFACE PHENOMENA; SURFACE TREATMENT; SURFACES; ULTRAVIOLET RADIATION; WETTING;

EID: 4344614508     PISSN: 10599495     EISSN: None     Source Type: Journal    
DOI: 10.1361/10599490419991     Document Type: Conference Paper
Times cited : (15)

References (58)
  • 2
    • 34848919386 scopus 로고
    • Surface studies by scanning tunneling microscopy
    • G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel: "Surface Studies by Scanning Tunneling Microscopy,"Phys. Rev. Lett., 1982, 49, pp. 57-61.
    • (1982) Phys. Rev. Lett. , vol.49 , pp. 57-61
    • Binnig, G.1    Rohrer, H.2    Gerber, Ch.3    Weibel, E.4
  • 4
    • 0027873591 scopus 로고
    • Spherulitic morphology of isotactic polypropylene investigated by scanning electron-microscopy
    • M. Aboulfaraj, B. Ulrich, A. Dahoun, and C. G'Sell: "Spherulitic Morphology of Isotactic Polypropylene Investigated by Scanning Electron-Microscopy,"Polymer, 1993, 34, pp. 4817-25.
    • (1993) Polymer , vol.34 , pp. 4817-4825
    • Aboulfaraj, M.1    Ulrich, B.2    Dahoun, A.3    G'Sell, C.4
  • 5
    • 0027840146 scopus 로고
    • The gamma-phase of high-molecular-weight polypropylene; 1. Morphological aspects
    • R.A. Campbell, P.J. Phillips, and J.S. Lin: "The Gamma-Phase of High-Molecular-Weight Polypropylene; 1. Morphological Aspects,"Polymer, 1993, 34, pp. 4809-16.
    • (1993) Polymer , vol.34 , pp. 4809-4816
    • Campbell, R.A.1    Phillips, P.J.2    Lin, J.S.3
  • 6
    • 0028767854 scopus 로고
    • Direct observation of right and left helical hands of syndiotactic polypropylene by atomic-force microscopy
    • W. Stocker, M. Schumacher, S. Graff, J. Lang, J.C. Wittmann, A.J. Lovinger, and B. Lotz: "Direct Observation of Right and Left Helical Hands of Syndiotactic Polypropylene by Atomic-Force Microscopy,"Macromolecules, 1994, 27, pp. 6948-55.
    • (1994) Macromolecules , vol.27 , pp. 6948-6955
    • Stocker, W.1    Schumacher, M.2    Graff, S.3    Lang, J.4    Wittmann, J.C.5    Lovinger, A.J.6    Lotz, B.7
  • 7
    • 43949150225 scopus 로고
    • Atomic-force microscopy of polymer crystals; 7. chain packing, disorder and imaging of methyl-groups in oriented isotactic polypropylene
    • D. Snetivy and G.J. Vancso: "Atomic-Force Microscopy of Polymer Crystals; 7. Chain Packing, Disorder and Imaging of Methyl-Groups in Oriented Isotactic Polypropylene,"Polymer, 1994, 35, pp. 461-67.
    • (1994) Polymer , vol.35 , pp. 461-467
    • Snetivy, D.1    Vancso, G.J.2
  • 8
    • 0029254146 scopus 로고
    • Surface-morphology of syndiotactic polypropylene single-crystals observed by atomic-force microscopy
    • V.V. Tsukruk and D.H. Reneker: "Surface-Morphology of Syndiotactic Polypropylene Single-Crystals Observed by Atomic-Force Microscopy, "Macromolecules, 1995, 28, pp. 1370-76.
    • (1995) Macromolecules , vol.28 , pp. 1370-1376
    • Tsukruk, V.V.1    Reneker, D.H.2
  • 9
    • 0031248853 scopus 로고    scopus 로고
    • Polymers under mechanical stress: Deformation of the nanostructure of isotactic polypropylene revealed by scanning force microscopy
    • G. Castelein, G. Coulon, and C. G'Sell: "Polymers Under Mechanical Stress: Deformation of the Nanostructure of Isotactic Polypropylene Revealed by Scanning Force Microscopy,"Polym. Eng. Sci, 1997, 37, pp. 1694-701.
    • (1997) Polym. Eng. Sci , vol.37 , pp. 1694-1701
    • Castelein, G.1    Coulon, G.2    G'Sell, C.3
  • 10
    • 2342471733 scopus 로고    scopus 로고
    • A nanoscopic view of structure and deformation of hard elastic polypropylene with scanning force microscopy
    • S. Hild, W. Gutmannsbauer, R. Luthi, J. Fuhrmann, and H.-J. Gruntherodt: "A Nanoscopic View of Structure and Deformation of Hard Elastic Polypropylene With Scanning Force Microscopy,"J. Polym. Sci.: Polym. Phys., 1996, 34, pp. 1953-59.
    • (1996) J. Polym. Sci.: Polym. Phys. , vol.34 , pp. 1953-1959
    • Hild, S.1    Gutmannsbauer, W.2    Luthi, R.3    Fuhrmann, J.4    Gruntherodt, H.-J.5
  • 13
    • 0032687889 scopus 로고    scopus 로고
    • Atomic force microscopy study of polypropylene surfaces treated by UV and ozone: Modification of morphology and adhesion force
    • H.-Y. Nie, M.J. Walzak, B. Berno, and N.S. McIntyre: "Atomic Force Microscopy Study of Polypropylene Surfaces Treated by UV and Ozone: Modification of Morphology and Adhesion Force,"Appl. Surf. Sci., 1999, 144-145, pp. 627-32.
    • (1999) Appl. Surf. Sci. , vol.144-145 , pp. 627-632
    • Nie, H.-Y.1    Walzak, M.J.2    Berno, B.3    McIntyre, N.S.4
  • 14
    • 0032673626 scopus 로고    scopus 로고
    • Applications of lateral force imaging to enhance topographic features of polypropylene film and photo-cured polymers
    • H.-Y. Nie, M.J. Walzak, N.S. McIntyre, and A.M. EL-Sherik: "Applications of Lateral Force Imaging to Enhance Topographic Features of Polypropylene Film and Photo-cured Polymers,"Appl. Surf. Sci., 1999, 144-145, pp. 633-37.
    • (1999) Appl. Surf. Sci. , vol.144-145 , pp. 633-637
    • Nie, H.-Y.1    Walzak, M.J.2    McIntyre, N.S.3    El-Sherik, A.M.4
  • 15
    • 0032660608 scopus 로고    scopus 로고
    • Microscopic stripe formation and adhesion force increase introduced by local shear-stress deformation of polypropylene film
    • H.-Y. Nie, M.J. Walzak, B. Berno, and N.S. McIntyre: "Microscopic Stripe Formation and Adhesion Force Increase Introduced by Local Shear-Stress Deformation of Polypropylene Film,"Langmuir, 1999, 15, pp. 6484-89.
    • (1999) Langmuir , vol.15 , pp. 6484-6489
    • Nie, H.-Y.1    Walzak, M.J.2    Berno, B.3    McIntyre, N.S.4
  • 16
    • 0033981948 scopus 로고    scopus 로고
    • Draw-ratio-dependent morphology of biaxially-oriented polypropylene films as determined by atomic force microscopy
    • H.-Y. Nie, M.J. Walzak, and N.S. McIntyre: "Draw-Ratio-Dependent Morphology of Biaxially-Oriented Polypropylene Films as Determined by Atomic Force Microscopy,"Polymer, 2000, 41, pp. 2213-18.
    • (2000) Polymer , vol.41 , pp. 2213-2218
    • Nie, H.-Y.1    Walzak, M.J.2    McIntyre, N.S.3
  • 17
    • 85158957798 scopus 로고    scopus 로고
    • Atomic force microscopy study of UV/ozone treated polypropylene films
    • K.L. Mittal, ed., VSP, Utrecht, The Netherlands
    • H.-Y. Nie, M.J. Walzak, and N.S. McIntyre: "Atomic Force Microscopy Study of UV/ozone Treated Polypropylene Films,"Polymer Surface Modification: Relevance to Adhesion, Vol. 2, K.L. Mittal, ed., VSP, Utrecht, The Netherlands, 2000, pp. 377-92.
    • (2000) Polymer Surface Modification: Relevance to Adhesion , vol.2 , pp. 377-392
    • Nie, H.-Y.1    Walzak, M.J.2    McIntyre, N.S.3
  • 18
    • 0035138781 scopus 로고    scopus 로고
    • A simple and effective method of evaluating atomic force microscopy tip performance
    • H.-Y. Nie and N.S. McIntyre: "A Simple and Effective Method of Evaluating Atomic Force Microscopy Tip Performance,"Langmuir, 2001, 17, pp. 432-36.
    • (2001) Langmuir , vol.17 , pp. 432-436
    • Nie, H.-Y.1    McIntyre, N.S.2
  • 19
    • 18744411255 scopus 로고    scopus 로고
    • Use of biaxially-oriented polypropylene film for evaluating and cleaning contaminated atomic force microscopy probe tips: An application to blind tip reconstruction
    • H.-Y. Nie, M.J. Walzak and N.S. McIntyre: "Use of Biaxially-Oriented Polypropylene Film for Evaluating and Cleaning Contaminated Atomic Force Microscopy Probe Tips: An Application to Blind Tip Reconstruction,"Rev. Sci. Instrum., 2002, 73, pp. 3831-36.
    • (2002) Rev. Sci. Instrum. , vol.73 , pp. 3831-3836
    • Nie, H.-Y.1    Walzak, M.J.2    McIntyre, N.S.3
  • 21
    • 0343642920 scopus 로고
    • Effects of aging and washing on UV and ozone-treated poly(ethylene terephthalate) and polypropylene
    • J.M. Hill, E. Karbashewski, A. Lin, M. Strobel, and M.J. Walzak: "Effects of Aging and Washing on UV and Ozone-Treated Poly(ethylene terephthalate) and Polypropylene,"J. Adhesion Sci. Technol., 1995, 9, pp. 1575-91.
    • (1995) J. Adhesion Sci. Technol. , vol.9 , pp. 1575-1591
    • Hill, J.M.1    Karbashewski, E.2    Lin, A.3    Strobel, M.4    Walzak, M.J.5
  • 23
    • 0037012493 scopus 로고    scopus 로고
    • Porous thin films for the characterization of atomic force microscope tip morphology
    • D. Vick, M.J. Brett and K. Westra: "Porous Thin Films for the Characterization of Atomic Force Microscope Tip Morphology,"Thin Solid Films, 2002, 408, pp. 79-86, and references therein.
    • (2002) Thin Solid Films , vol.408 , pp. 79-86
    • Vick, D.1    Brett, M.J.2    Westra, K.3
  • 24
    • 0024303863 scopus 로고
    • The mechanism of phase-separation of polymers in organic media - Apolar and polar systems
    • C.J. van Oss, M.K. Chaudhury, and R.J. Good: "The Mechanism of Phase-separation of Polymers in Organic Media - Apolar and Polar Systems,"Sep. Sci. Technol., 1989, 24, pp. 15-30.
    • (1989) Sep. Sci. Technol. , vol.24 , pp. 15-30
    • Van Oss, C.J.1    Chaudhury, M.K.2    Good, R.J.3
  • 27
    • 0003332544 scopus 로고    scopus 로고
    • Mechanical properties
    • J.E. Mark, ed., American Institute of Physics, New York
    • W. Brostow, J. Kubat, and M.M. Kubat: "Mechanical Properties,"Physical Properties of Polymers Handbook, J.E. Mark, ed., American Institute of Physics, New York, 1996, pp. 313-34.
    • (1996) Physical Properties of Polymers Handbook , pp. 313-334
    • Brostow, W.1    Kubat, J.2    Kubat, M.M.3
  • 28
    • 0026224474 scopus 로고
    • Measurement of the mechanical-properties of silicon microresonators
    • L.M. Zhang, D. Uttamchandani, and B. Culshaw: "Measurement of the Mechanical-Properties of Silicon Microresonators,"Sensors and Actuators A, 1991, 29, pp. 79-84.
    • (1991) Sensors and Actuators A , vol.29 , pp. 79-84
    • Zhang, L.M.1    Uttamchandani, D.2    Culshaw, B.3
  • 29
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • K.E. Petersen: "Silicon as a Mechanical Material,"Proceedings of the IEEE, 1982, 70, pp. 420-57.
    • (1982) Proceedings of the IEEE , vol.70 , pp. 420-457
    • Petersen, K.E.1
  • 30
    • 36849141789 scopus 로고
    • Young's modulus, shear modulus, and poisson's ratio in silicon and germanium
    • J.J. Wortman and R.A. Evans: "Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and Germanium,"J. App. Phys., 1965, 36, pp. 153-56.
    • (1965) J. App. Phys. , vol.36 , pp. 153-156
    • Wortman, J.J.1    Evans, R.A.2
  • 31
    • 0028257345 scopus 로고
    • Atomic-force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure
    • P. Markiewicz and M.C. Goh: "Atomic-Force Microscopy Probe Tip Visualization and Improvement of Images Using a Simple Deconvolution Procedure,"Langmuir, 1994, 10, pp. 5-7.
    • (1994) Langmuir , vol.10 , pp. 5-7
    • Markiewicz, P.1    Goh, M.C.2
  • 32
    • 0001305897 scopus 로고
    • Three-dimensional probe reconstruction for atomic force microscopy
    • J. Vesenka, R. Miller, and E. Henderson: "Three-Dimensional Probe Reconstruction for Atomic Force Microscopy,"Rev. Sci. Instrum., 1994, 65, pp. 2249-51.
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 2249-2251
    • Vesenka, J.1    Miller, R.2    Henderson, E.3
  • 33
    • 0028698741 scopus 로고
    • Morphological estimation of tip geometry for scanned probe microscopy
    • J.S. Villarrubia: "Morphological Estimation of Tip Geometry for Scanned Probe Microscopy,"Surf. Sci., 1994, 321, pp. 287-300.
    • (1994) Surf. Sci. , vol.321 , pp. 287-300
    • Villarrubia, J.S.1
  • 34
    • 36449002179 scopus 로고
    • Atomic-force microscope tip deconvolution using calibration arrays
    • P. Markiewicz and M.C. Goh: "Atomic-Force Microscope Tip Deconvolution Using Calibration Arrays,"Rev. Sci. Instrum., 1995, 66, pp. 3186-90.
    • (1995) Rev. Sci. Instrum. , vol.66 , pp. 3186-3190
    • Markiewicz, P.1    Goh, M.C.2
  • 35
    • 0342980198 scopus 로고
    • Simulation of atomic-force microscope tip-sample sample-tip reconstruction
    • P. Markiewicz and M.C. Goh: "Simulation of Atomic-Force Microscope Tip-Sample Sample-Tip Reconstruction,"J. Vac. Sci. & Technol. B, 1995, 13, pp. 1115-18.
    • (1995) J. Vac. Sci. & Technol. B , vol.13 , pp. 1115-1118
    • Markiewicz, P.1    Goh, M.C.2
  • 36
    • 0001365643 scopus 로고    scopus 로고
    • Blind restoration method of scanning tunneling and atomic force microscopy images
    • S. Dongmo, M. Troyon, P. Vautrot, E. Delain, and N. Bonnet: "Blind Restoration Method of Scanning Tunneling and Atomic Force Microscopy Images,"J. Vac. Sci. & Technol. B, 1996, 14, pp. 1552-56.
    • (1996) J. Vac. Sci. & Technol. B , vol.14 , pp. 1552-1556
    • Dongmo, S.1    Troyon, M.2    Vautrot, P.3    Delain, E.4    Bonnet, N.5
  • 39
    • 5844266920 scopus 로고    scopus 로고
    • Deconvolution of tip affected atomic force microscope images and comparison to rutherford backscattering
    • M.F. Tabet and F.K, Urban: "Deconvolution of Tip Affected Atomic Force Microscope Images and Comparison to Rutherford Backscattering,"J. Vac. Sci. & Technol. B, 1997, 75, pp. 800-04.
    • (1997) J. Vac. Sci. & Technol. B , vol.75 , pp. 800-804
    • Tabet, M.F.1    Urban, F.K.2
  • 40
    • 8744234038 scopus 로고    scopus 로고
    • Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation
    • J.S. Villarrubia: "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation,"J. Res. Natl. Inst. Stan., 1997, 102, pp. 425-54.
    • (1997) J. Res. Natl. Inst. Stan. , vol.102 , pp. 425-454
    • Villarrubia, J.S.1
  • 42
    • 0035501372 scopus 로고    scopus 로고
    • A method to improve the quantitative analysis of SFM images at the nanoscale
    • A. Todd and S.J. Eppell: "A Method to Improve the Quantitative Analysis of SFM Images at the Nanoscale,"Surf. Sci., 2001, 491, pp. 473-83.
    • (2001) Surf. Sci. , vol.491 , pp. 473-483
    • Todd, A.1    Eppell, S.J.2
  • 43
    • 0000561825 scopus 로고
    • Submicron probe of polymer adhesion with atomic force microscopy-dependence on topography and material inhomogeneities
    • H.A. Mizes, L.-G. Loh, R.J. Miller, S.K. Ahuja, and E.F. Grabowski: "Submicron Probe of Polymer Adhesion With Atomic Force Microscopy- Dependence on Topography and Material Inhomogeneities,"Appl. Phys. Lett., 1991, 59, pp. 2901-03.
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 2901-2903
    • Mizes, H.A.1    Loh, L.-G.2    Miller, R.J.3    Ahuja, S.K.4    Grabowski, E.F.5
  • 44
    • 0028521629 scopus 로고
    • Imaging adhesion forces and elasticity of lysozyme adsorbed on mica with the atomic-force microscope
    • M. Radmacher, M. Fritz, J.P. Cleveland, D.A. Walters, and P.K. Hansma: "Imaging Adhesion Forces and Elasticity of Lysozyme Adsorbed on Mica With the Atomic-Force Microscope,"Langmuir, 1994, 10, pp. 3809-14.
    • (1994) Langmuir , vol.10 , pp. 3809-3814
    • Radmacher, M.1    Fritz, M.2    Cleveland, J.P.3    Walters, D.A.4    Hansma, P.K.5
  • 45
    • 0030601122 scopus 로고    scopus 로고
    • Adhesion of iron oxide to silica studied by atomic force microscopy
    • G. Toikka, R.A. Hayes, and J. Ralston: "Adhesion of Iron Oxide to Silica Studied by Atomic Force Microscopy,"J. Colloid Interface Sci., 1996, 180, pp. 329-38.
    • (1996) J. Colloid Interface Sci. , vol.180 , pp. 329-338
    • Toikka, G.1    Hayes, R.A.2    Ralston, J.3
  • 46
    • 0031556161 scopus 로고    scopus 로고
    • Scanning force microscopy with chemical specificity: An extensive study of chemically specific tip-surface interactions and the chemical imaging of surface functional groups
    • E.W. van der Vegte and G. Hadziioannou: "Scanning Force Microscopy with Chemical Specificity: An Extensive Study of Chemically Specific Tip-Surface Interactions and the Chemical Imaging of Surface Functional Groups,"Langmuir, 1997, 13, pp. 4357-68.
    • (1997) Langmuir , vol.13 , pp. 4357-4368
    • Van Der Vegte, E.W.1    Hadziioannou, G.2
  • 47
    • 0031646940 scopus 로고    scopus 로고
    • Toward a force spectroscopy of polymer surfaces
    • K. Feldman, T. Tervoort, P. Smith, and N.D. Spencer: "Toward a Force Spectroscopy of Polymer Surfaces,"Langmuir, 1998, 14, pp. 372-28.
    • (1998) Langmuir , vol.14 , pp. 372-428
    • Feldman, K.1    Tervoort, T.2    Smith, P.3    Spencer, N.D.4
  • 48
    • 21544451468 scopus 로고
    • Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
    • G. Meyer and N. Amer.: "Simultaneous Measurement of Lateral and Normal Forces With an Optical-Beam-Deflection Atomic Force Microscope, "Appl. Phys. Lett., 1990, 57, pp. 2089-91.
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 2089-2091
    • Meyer, G.1    Amer, N.2
  • 50
    • 0031551394 scopus 로고    scopus 로고
    • Nanometer-scale surface properties of mixed phospholipid monolayers and bilayers
    • Y.F. Dufrene, W.R. Barger. J.-B.D. Green, and G.U. Lee: "Nanometer-Scale Surface Properties of Mixed Phospholipid Monolayers and Bilayers,"Langmuir, 1997, 13, pp. 4779-84.
    • (1997) Langmuir , vol.13 , pp. 4779-4784
    • Dufrene, Y.F.1    Barger, W.R.2    Green, J.-B.D.3    Lee, G.U.4
  • 51
    • 0028444305 scopus 로고
    • Local properties of phase-separated polymer surfaces by force microscopy
    • M. Motomatsu, H.-Y. Nie, W. Mizutani, and H. Tokumoto: "Local Properties of Phase-Separated Polymer Surfaces by Force Microscopy,"Jpn. J. Appl. Phys., 1994, 33, pp. 3775-78.
    • (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 3775-3778
    • Motomatsu, M.1    Nie, H.-Y.2    Mizutani, W.3    Tokumoto, H.4
  • 52
    • 0027610690 scopus 로고
    • Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy
    • Q. Zhong, D. Inniss, K. Kjoller, and V.B. Elings: "Fractured Polymer Silica Fiber Surface Studied by Tapping Mode Atomic-Force Microscopy, "Surf. Sci., 1993, 290, pp. L688-92.
    • (1993) Surf. Sci. , vol.290
    • Zhong, Q.1    Inniss, D.2    Kjoller, K.3    Elings, V.B.4
  • 54
    • 3743070568 scopus 로고    scopus 로고
    • Deformation, contact time, and phase contrast in tapping mode scanning force microscopy
    • J. Tamayo and R. Garcia: "Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force Microscopy,"Langmuir, 1996, 12, pp. 4430-35.
    • (1996) Langmuir , vol.12 , pp. 4430-4435
    • Tamayo, J.1    Garcia, R.2
  • 56
    • 0035352084 scopus 로고    scopus 로고
    • Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope
    • B.Y. Du, M.R. VanLandingham, Q.L. Zhang, and T.B. He: "Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope,"J. Mater. Res., 2001, 16, pp. 1487-92.
    • (2001) J. Mater. Res. , vol.16 , pp. 1487-1492
    • Du, B.Y.1    Vanlandingham, M.R.2    Zhang, Q.L.3    He, T.B.4
  • 57
    • 0038459509 scopus 로고    scopus 로고
    • Evaluation of intermittent contact mode AFM probes by HREM and using atomically sharp CeO2 ridges as tip characterizer
    • B. Skarman, L.R. Wallenberg, S.N. Jacobsen, U. Helmersson, and C. Thelander: "Evaluation of Intermittent Contact Mode AFM Probes by HREM and Using Atomically Sharp CeO2 Ridges as Tip Characterizer,"Langmuir, 2000, 16, pp. 6267-77.
    • (2000) Langmuir , vol.16 , pp. 6267-6277
    • Skarman, B.1    Wallenberg, L.R.2    Jacobsen, S.N.3    Helmersson, U.4    Thelander, C.5
  • 58
    • 0037007322 scopus 로고    scopus 로고
    • Bilayer and odd-numbered multilayers of octadecylphosphonic acid formed on Si substrate studied by atomic force microscopy
    • H.-Y. Nie, M.J. Walzak, and N.S. McIntyre: "Bilayer and Odd-Numbered Multilayers of Octadecylphosphonic Acid Formed on Si Substrate Studied by Atomic Force Microscopy,"Langmuir, 2002, 18, pp. 2955-58.
    • (2002) Langmuir , vol.18 , pp. 2955-2958
    • Nie, H.-Y.1    Walzak, M.J.2    McIntyre, N.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.