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Volumn 103, Issue 8, 2008, Pages

Formation of (Ti,Al) NTi2AlN multilayers after annealing of TiNTiAl (N) multilayers deposited by ion beam sputtering

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ION BEAMS; SPUTTERING; TITANIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 43149088021     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2894589     Document Type: Article
Times cited : (28)

References (51)
  • 5
    • 0032594978 scopus 로고    scopus 로고
    • J. Smolik, Vacuum 55, 147 (1999).
    • (1999) Vacuum , vol.55 , pp. 147
    • Smolik, J.1
  • 26
    • 43149088071 scopus 로고    scopus 로고
    • Abstracts of the 30th International Conference of Advanced Ceramics and Composites, Cocoa Beach, January (unpublished). Abstract No. ICACC-S1184.
    • J.-P. Palmquist, T. El-Raghy, J. Howing, O. Wilhemsson, and M. Sundberg, Abstracts of the 30th International Conference of Advanced Ceramics and Composites, Cocoa Beach, January 2006 (unpublished). Abstract No. ICACC-S1184.
    • (2006)
    • Palmquist, J.-P.1    El-Raghy, T.2    Howing, J.3    Wilhemsson, O.4    Sundberg, M.5
  • 37
    • 43149099712 scopus 로고    scopus 로고
    • Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd ed. (Plenum, New York).
    • R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd ed. (Plenum, New York, 1996).
    • (1996)
    • Egerton, R.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.