SCOPUS 정보 검색 플랫폼

Journal of Materials Science and Technology

Volumn 23, Issue 2, 2007, Pages 145-165

TEM investigations on layered ternary ceramics

(3) Lin, Zhijun a,b Li, Meishuan a Zhou, Yanchun a

a INSTITUTE OF METAL RESEARCH (China)

b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

Author keywords

Interfacial structure; Layered ternary ceramics; MAX phase; STEM; TEM

Indexed keywords

CERAMIC MATERIALS; CHARACTERIZATION; CHEMICAL PROPERTIES; CRYSTAL STRUCTURE; DEFECT STRUCTURES; MECHANICAL PROPERTIES; MECHANISMS; MICROSTRUCTURE; PHYSICAL PROPERTIES; PROCESSING; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); INTERFACIAL STRUCTURE; LAYERED TERNARY CERAMICS; MAX PHASE; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SELECTED AREA ELECTRON DIFFRACTION (SAED);

CERMETS;

EID: 34248160356 PISSN: 10050302 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (87)

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