Oriented growth of silicide and carbon in SiC-based sandwich structures with nickel

Materials Chemistry and Physics

Volumn 110, Issue 2-3, 2008, Pages 303-310

  Hahnel A ^a   Ischenko, V ^a   Woltersdorf, J ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Graphitic carbon; High resolution and analytical electron microscopy; Nickel silicide; Silicon carbide; Textured growth; Thin films

Indexed keywords

CARBON; ELECTRON MICROSCOPY; NICKEL COMPOUNDS; SANDWICH STRUCTURES; SILICON CARBIDE;

GRAPHITIC CARBON; ORIENTED GROWTH; TEXTURED GROWTH;

SILICIDES;

EID: 43049134495     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.02.009     Document Type: Article

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