Structuring of carbon layers in Si-C-O systems studied on atomic scale

Thin Solid Films

Volumn 482, Issue 1-2, 2005, Pages 19-23

  Hahnel A ^a   Woltersdorf, J ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Composite materials; High resolution and analytical electron microscopy; Metal mediated graphitisation; SiC

Indexed keywords

CARBIDES; COMPOSITE MATERIALS; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; SILICON WAFERS; X RAY SPECTROSCOPY;

BOROSILICATE; HIGH RESOLUTION AND ANALYTICAL ELECTRON MICROSCOPY; METAL-MEDIATED GRAPHITIZATION; SIC;

CARBON;

EID: 17644414966     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.111     Document Type: Conference Paper

References (20)

1. A.G. Evans, and D.B. Marshall Acta Metall. 37 1989 2567
2. G. Grathwohl, M. Kuntz, E. Pippel, and J. Woltersdorf Phys. Status Solidi (A) 146 1994 393
3. G. Grathwohl, J. Woltersdorf, A. Hähnel, M. Kuntz, E. Pippel, and R. Schneider Bildung, Struktur, Nanochemie und Funktion von Grenzschichten in keramischen Faserverbundwerkstoffen 1996 VDI-Verlag Düsseldorf 3-18-345305-3
4. R. Naslain, O. Dugne, A. Guette, J. Sevely, C.R. Brosse, J.P. Rocher, and J. Cotteret J. Am. Ceram. Soc. 74 1991 2482
5. E. Pippel, J. Woltersdorf, A. Hähnel, and R. Schneider Ceram. Trans. (American Ceramic Society) 57 1995 273
6. R.F. Cooper, and K. Chyung J. Mater. Sci. 22 1987 3148
7. P.M. Benson, K.E. Spear, and G.C. Pantano Ceram. Eng. Sci. Proc. 9 1988 663
8. L.A. Bonney, and R.F. Cooper J. Am. Ceram. Soc. 73 1990 2916
9. C. Ponthieu, M. Lancin, and J. Thibault-Desseaux Phila. Mag. A 62 1990 605
10. C. Ponthieu, C. Marhic, M. Lancin, and N. Herbots J. Mater. Sci. 29 1994 4535
11. H. Shin J. Am. Ceram. Soc. 78 1995 3153
12. A. Kumar, and K.M. Knowles Acta Mater. 44 1996 2901
13. A. Kumar, and K.M. Knowles J. Am. Ceram. Soc. 79 1996 2364
14. R. Schneider, J. Woltersdorf, and A. Röder Microchim. Acta 125 1997 361
15. A. Hähnel, R. Schneider, E. Pippel, J. Woltersdorf, and D. Suttor Compos., Part A 27A 1996 685
16. E. Pippel, A. Hähnel, and J. Woltersdorf Silic. Ind.-Ceram. Sci. Technol. 64 1999 15
17. A. Hähnel, E. Pippel, and J. Woltersdorf Cryst. Res. Technol. 35 2000 663
18. A. Hähnel, and J. Woltersdorf Mater. Chem. Phys. 83 2004 380
19. R. Sinclair, T. Itoh, and R. Chin Microsc. Microanal. 8 2002 288
20. C. Hayzelden, and J.L. Batstone J. Appl. Phys. 73 1993 8279