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Volumn 32, Issue 24, 1997, Pages 6567-6572

Interfacial reaction and adhesion between SiC and thin sputtered nickel films

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ANNEALING; CERAMIC MATERIALS; CHEMICAL REACTIONS; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; SILICON CARBIDE; SILICON COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 0031343251     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018623613741     Document Type: Article
Times cited : (30)

References (32)
  • 1
    • 26744456328 scopus 로고
    • edited by J. Kriegermann Deutsche Keramische Gesellschaft, Köln
    • K. D. MÖRGENTHAR, Tech. Keram. 2, edited by J. Kriegermann (Deutsche Keramische Gesellschaft, Köln, 1990) 29.
    • (1990) Tech. Keram. , vol.2 , pp. 29
    • Mörgenthar, K.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.