On the peculiarities of bright/dark contrast in HRTEM images of SiC polytypes

Ultramicroscopy

Volumn 76, Issue 1-2, 1999, Pages 21-37

  Kaiser, U ^a   Chuvilin, A ^b   Richter, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

Author keywords

Anomalous contrast; HRTEM; Image simulation; Noncentrosymmetric structure; Silicon carbide

Indexed keywords

SILICON; SILICON CARBIDE; SILICON DERIVATIVE; UNCLASSIFIED DRUG;

ANISOTROPY; ARTICLE; BRIGHTNESS; CONTRAST ENHANCEMENT; CRYSTAL; DARKNESS; SIMULATION; TILTING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033012913     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00069-2     Document Type: Article

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