Microstructure, crystallinity, and properties of low-pressure MOCVD-grown europium oxide films

Materials Chemistry and Physics

Volumn 110, Issue 2-3, 2008, Pages 337-343

  Singh, M P ^a   Shalini, K ^a   Shivashankar, S A ^a   Deepak, G C ^a   Bhat, N ^a   Shripathi, T ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Microstructure; MOCVD; Properties; Rare earth oxides; Thin films

Indexed keywords

CRYSTAL STRUCTURE; EUROPIUM COMPOUNDS; LOW PRESSURE CHEMICAL VAPOR DEPOSITION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; SURFACE PROPERTIES; THIN FILMS;

OXYGEN DEFICIENCY; PARASITIC PHASES; POST DEPOSITION ANNEALING; RARE EARTH OXIDES; WELL PACKED SPHERICAL MOUNDS;

OXIDE FILMS;

EID: 42949153739     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.02.017     Document Type: Article

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