Non-linear registration of scanning probe microscopy images

Nanotechnology

Volumn 17, Issue 3, 2006, Pages 881-887

  Scherdel, S ^a   Wirtz, S ^b   Rehse, N ^a   Magerle, R ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF LÜBECK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; IMAGING SYSTEMS; NICKEL; OPTICAL RESOLVING POWER; PIEZOELECTRIC DEVICES; POLYMERS; SUPERALLOYS; THIN FILM CIRCUITS;

MICROSCOPY IMAGES; NANOTOMOGRAPHY; PIEZO-SCANNERS; SCANNING PROBE MICROSCOPY (SPM);

NANOTECHNOLOGY;

EID: 31044444723     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/3/044     Document Type: Article

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