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Volumn 615, Issue 2, 2008, Pages 124-134

FFT impedance spectroscopy analysis of the growth of anodic oxides on (1 0 0) p-Si for various solvents

Author keywords

Anodic oxidation; Impedance spectroscopy; Organic solvents; Semiconductor electrochemistry; Silicon; Silicon dioxide

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; FAST FOURIER TRANSFORMS; ORGANIC SOLVENTS;

EID: 41349093745     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2007.12.011     Document Type: Article
Times cited : (16)

References (52)
  • 11
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    • J. Carstensen, R. Prange, H. Föll, in: Proceedings of ECS' 193rd Meeting, San Diego, 148 (1998).
    • J. Carstensen, R. Prange, H. Föll, in: Proceedings of ECS' 193rd Meeting, San Diego, 148 (1998).
  • 29
    • 85009062401 scopus 로고    scopus 로고
    • R. Prange, J. Carstensen, and H. Föll, in: Proceedings of ECS' 193rd Meeting, San Diego, 158, 1998.
    • R. Prange, J. Carstensen, and H. Föll, in: Proceedings of ECS' 193rd Meeting, San Diego, 158, 1998.
  • 39
    • 85009103933 scopus 로고    scopus 로고
    • V.P. Parkhutik, Y. Chu, Z. Nagy, P.A. Montano, in: International Conference: Porous Semiconductors - Science and Technology (Extended Abstracts), 16, 1998.
    • V.P. Parkhutik, Y. Chu, Z. Nagy, P.A. Montano, in: International Conference: Porous Semiconductors - Science and Technology (Extended Abstracts), 16, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.