On the origin of electrochemical oscillations at silicon electrodes

Journal of the Electrochemical Society

Volumn 143, Issue 4, 1996, Pages 1313-1318

  Lehmann, V ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTROLYTES; ELLIPSOMETRY; HYDROFLUORIC ACID; MODELS; MORPHOLOGY; OSCILLATIONS; OXIDES; SEMICONDUCTING SILICON; STRESSES;

ELECTROCHEMICAL OSCILLATIONS; SILICON ELECTRODES; STRUCTURAL TRANSITION; THIN ANODIC OXIDE; X RAY REFLECTOMETRY;

ELECTROCHEMICAL ELECTRODES;

EID: 0030127993     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1836636     Document Type: Article

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