|
Volumn 4, Issue 6, 2007, Pages 1883-1887
|
Quantitative modelling of voltage oscillations and other oscillatory phenomena with the current burst model
|
Author keywords
[No Author keywords available]
|
Indexed keywords
APPLIED SURFACE;
CAPACITIVE EFFECTS;
CORRELATION LENGTHS;
CURRENT OSCILLATIONS;
CURRENT-BURST MODELS;
DATA EXTRACTION;
MONTE-CARLO;
NON-LINEAR;
OSCILLATORY PHENOMENA;
OXIDE THICKNESSES;
PATTERN FORMATIONS;
POTENTIOSTATIC CONDITIONS;
SI ELECTRODES;
VOLTAGE OSCILLATIONS;
CEMENTS;
CHLORINE COMPOUNDS;
ELECTROLYSIS;
METALLIZING;
SILICON;
SURFACE ANALYSIS;
MOTION ESTIMATION;
|
EID: 41349120775
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200674308 Document Type: Conference Paper |
Times cited : (4)
|
References (9)
|