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Volumn 963, Issue , 2006, Pages 222-227

Fabrication and characteristics of low doped gallium-zinc oxide thin film transistor

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRIC POTENTIAL; MAGNETRON SPUTTERING; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DOPING;

EID: 40949130451     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0963-q12-01     Document Type: Conference Paper
Times cited : (1)

References (33)
  • 13
    • 40949163261 scopus 로고    scopus 로고
    • 13.1. Yagi, K. Tsukagoshi and Y. Aoyagi, Appl. Phys. Lett. 86, 103502, (2005).
    • 13.1. Yagi, K. Tsukagoshi and Y. Aoyagi, Appl. Phys. Lett. 86, 103502, (2005).
  • 33
    • 23744515183 scopus 로고    scopus 로고
    • II-D. Kim, Y. W. Choi and H. L. Tuller, Appl. Phys. Lett. 87, 043509 (2005).
    • II-D. Kim, Y. W. Choi and H. L. Tuller, Appl. Phys. Lett. 87, 043509 (2005).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.