Progress in semiconducting oxide-based thin-film transistors for displays

Semiconductor Science and Technology

Volumn 20, Issue 8, 2005, Pages 720-725

  Li, Y J ^a   Kwon, Y W ^a   Jones, M ^a   Heo, Y W ^a   Zhou, J ^a   Luo, S C ^a   Holloway, P H ^a   Douglas, E ^a   Norton, D P ^a   Park, Z ^a   Li, S ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; DISPLAY DEVICES; LEAKAGE CURRENTS; PHOTOLITHOGRAPHY; REDUCTION; SEMICONDUCTOR MATERIALS; ZINC OXIDE;

ACTIVE CHANNEL LAYERS; CHANNEL MATERIALS; DISPLAY TECHNOLOGY; TRANSPARENT OXIDES;

THIN FILM TRANSISTORS;

EID: 22844431732     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/20/8/012     Document Type: Article

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