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Thin Solid Films

Volumn 288, Issue 1-2, 1996, Pages 29-31

Synthesis and optelectronic characterization of gallium doped zinc oxide transparent electrodes

(7) Hirata, G A a,b McKittrick, J a Cheeks, T a Siqueiros, J M b Diaz, J A b Contreras, O b Lopez, O A a

a UNIVERSITY OF CALIFORNIA (United States)

b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO (Mexico)

Author keywords

Electrical properties and measurements; Laser ablation; Optical properties; Zinc oxide

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC VARIABLES MEASUREMENT; FILM GROWTH; GALLIUM; LASER ABLATION; OPACITY; OPTICAL VARIABLES MEASUREMENT; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

PULSED LASER DEPOSITION; TRANSPARENT ELECTRODES;

SEMICONDUCTING FILMS;

EID: 0030289497 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)08862-1 Document Type: Article

Times cited : (168)

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