Quantum size effect in low energy electron diffraction of thin films

Applied Surface Science

Volumn 169-170, Issue , 2001, Pages 82-87

  Altman, M S ^a   Chung, W F ^a   He, Z Q ^a   Poon, H C ^b   Tong, S Y ^b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; COPPER; ELECTRON MICROSCOPY; ELECTRON SCATTERING; LOW ENERGY ELECTRON DIFFRACTION; MOLYBDENUM; QUANTUM THEORY; SILVER; THIN FILMS; TUNGSTEN;

LOW ENERGY ELECTRON MICROSCOPY; QUANTUM SIZE EFFECT;

METALLIC FILMS;

EID: 4344586069     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00644-9     Document Type: Article

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