Probing molecules in integrated silicon-molecule-metal junctions by inelastic tunneling spectroscopy

Nano Letters

Volumn 8, Issue 2, 2008, Pages 478-484

  Wang, Wenyong ^a   Scott, Adina ^b   Gergel Hackett, Nadine ^a   Hacker, Christina A ^a   Janes, David B ^b   Richter, Curt A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INELASTIC TUNNELING SPECTROSCOPY; MOLECULAR DEVICES; MOLECULAR INTEGRITY; SEMICONDUCTOR MICROELECTRONICS;

CARRIER TRANSPORT; MOLECULAR ELECTRONICS; MONOLAYERS; NANOELECTRONICS;

SEMICONDUCTOR JUNCTIONS;

METAL; NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; ELASTICITY; EQUIPMENT; EVALUATION; GENETIC PROCEDURES; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SYSTEM ANALYSIS; ULTRASTRUCTURE;

ELASTICITY; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; METALS; MICROELECTRODES; MICROSCOPY, SCANNING TUNNELING; MOLECULAR PROBE TECHNIQUES; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SILICON; SPECTRUM ANALYSIS; SYSTEMS INTEGRATION;

EID: 40449132774     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0725289     Document Type: Article

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