Electrical characterization of metal-molecule-silicon junctions

Superlattices and Microstructures

Volumn 33, Issue 4, 2003, Pages 217-226

  Wang, W ^a   Lee, T ^a   Kamdar, M ^a   Reed, M A ^a   Stewart, M P ^b   Hwang, J J ^b   Tour, J M ^b  

^a YALE UNIVERSITY   (United States)

^b RICE UNIVERSITY   (United States)

Author keywords

Diazonium; Hybrid organic semiconductor devices; Silicon; Tunneling

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; HYDRIDES; INTERFACES (MATERIALS); MOLECULAR STRUCTURE; MONOLAYERS; REACTION KINETICS; SALTS; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

ARYL DIAZONIUM SALT; BENZENEDIAZONIUM TETRAFLUOROBORATE; HYBRID ORGANIC SEMICONDUCTOR DEVICE; METAL-MOLECULE-SILICON JUNCTION;

SEMICONDUCTOR JUNCTIONS;

EID: 0345829239     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0749-6036(03)00081-8     Document Type: Article

References (29)

1. A. Aviram, M.A. Ratner (Eds.), Molecular Electronics: Science and Technology, The Annals of the New York Academy of Sciences, vol. 852, The New York Academy of Sciences, New York, 1998.
2. R.M. Metzger, B. Chen, U. Holpfner, M.V. Lakshmikantham, D. Vuillaume, T. Kawai, X. Wu, H. Tachibana, T.V. Hughes, H. Sakurai, J.W. Baldwin, C. Hosch, M.P. Cava, L. Brehmer, G.J. Ashwell, J. Am. Chem. Soc. 119 (1997) 10455.
3. M.A. Reed, C. Zhou, C.J. Muller, T.P. Burgin, J.M. Tour, Science 278 (1997) 252.
4. J. Chen, M.A. Reed, A.M. Rawlett, J.M. Tour, Science 286 (1999) 1550.
5. C.P. Collier, G. Mattersteig, E.W. Wong, Y. Luo, K. Beverly, J. Sampaio, F.M. Raymo, J.F. Stoddart, J.R. Heath, Science 289 (2000) 1172.
6. J. Park, A.N. Pasupathy, J.I. Goldsmith, C. Chang, Y. Yaish, J.R. Petta, M. Rinkoski, J.P. Sethna, H.D. Abruna, P.L. McEuen, D.C. Ralph, Nature 417 (2002) 722.
7. A. Ulman, An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly, Academic Press, Boston, 1991.
8. J.M. Buriak, Chem. Rev. 102 (2002) 1271.
9. C. Boulas, J.V. Davidovits, F. Rondelez, D. Vuillaume, Phys. Rev. Lett. 76 (1996) 4797.
10. Y. Selzer, A. Salomon, D. Cahen, J. Chem. Phys. B 106 (2002) 10432.
11. D. Li, A. Bishop, Y. Gim, X.B. Shi, M.R. Fitzsimmons, Q.X. Jia, Appl. Phys. Lett. 73 (1998) 2645.
12. A. Vilan, A. Shanzer, D. Cahen, Nature 404 (2000) 166.
13. I.H. Campbell, S. Rubin, T.A. Zawodzinski, J.D. Kress, R.L. Martin, D.L. Smith, Phys. Rev. B 54 (1996) 14321.
14. M. Delamar, R. Hitmi, J. Pinson, J.M. Saveant, J. Am. Chem. Soc. 114 (1992) 5883.
15. P. Allongue, C.H. de Villeneuve, J. Pinson, F. Ozanam, J.-N. Chazalviel, X. Wallart, Electrochim. Acta. 43 (1998) 2791.
16. P. Allongue, M. Delamar, B. Desbat, O. Fagebaume, R. Hitmi, J. Pinson, J.-M. Saveant, J. Am. Chem. Soc. 119 (1997) 201.
17. D.V. Kosynkin, J.M. Tour, Org. Lett. 3 (2000) 993.
18. M.P. Stewart, F. Maya, D.V. Kosynkin, S.M. Dirk, J.J. Stapleton, C.L. McGuiness, D.L. Allara, J.M. Tour, submitted for publication.
19. P. Hartig, J. Rappich, Th. Dittrich, Appl. Phys. Lett. 80 (2002) 67.
20. NIST X-ray photoelectron spectroscopy database version 3.2. Available fromhttp://srdata.nist.gov/xps/.
21. J.-O. Lee, G. Lientschnig, F. Wiertz, M. Struijk, R.A.J. Janssen, R. Egberink, D.N. Reinhoudt, P. Hadley, C. Dekker, Nano Lett. 3 (2003) 113.
22. C.R. Kagan, A. Afzali, R. Martel, L.M. Gignac, P.M. Solomon, A.G. Schrott, B. Ek, Nano Lett. 3 (2003) 119.
23. W. Wang, T. Lee, M.A. Reed, Phys. Rev. B 68 (2003) 035416.
24. M. Di Ventra, S.T. Pantelides, N.D. Lang, Phys. Rev. Lett. 84 (2000) 979.
25. S. Datta, W. Tian, S. Hong, R. Reinfenberger, J.L. Henderson, C.P. Kubiak, Phys. Rev. Lett. 79 (1997) 2530.
26. E.A. Rhoderick, R.H. Williams, Metal-Semiconductor Contacts, Clarendon Press, Oxford, UK, 1988.
27. J.G. Simmons, J. Appl. Phys. 34 (1963) 1793.
28. S.M. Sze, Physics of Semiconductor Devices, Wiley, New York, 1981.
29. M.A. Ratner, B. Davis, M. Kemp, V. Mujica, A. Roitberg, S. Yaliraki, in: A. Aviram, M. Ratner (Eds.), Molecular Electronics: Science and Technology, The Annals of the New York Academy of Sciences, vol. 852, The New York Academy of Sciences, New York, 1998.