Imaging nanoscale spatio-temporal thermal fluctuations

Nano Letters

Volumn 6, Issue 5, 2006, Pages 887-889

  Crider, P S ^a   Israeloff, N E ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FORCE MICROSCOPY; QUASI STATIC PROCESS; SPACE-TIME NANOSCALE DYNAMICS; SPATIO-TEMPORAL THERMAL FLUCTUATIONS;

GLASS TRANSITION; MICROSCOPIC EXAMINATION; POLARIZATION; POLYMERS; THERMAL EFFECTS; THIN FILMS;

INFRARED IMAGING;

GLASS; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; HEAT; METHODOLOGY; NANOTECHNOLOGY; STATISTICS;

GLASS; HOT TEMPERATURE; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; POLYMERS;

EID: 33744832031     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl060558q     Document Type: Article

References (7)

1. (a) Weeks, E. R.; Weitz, D. A. Phys. Rev. Lett. 2002, 89, 095704.
2. (b) Vidal Russell, E.; Israeloff, N. E. Nature 2000, 408, 695-698.
3. Mason, T. G.; Weitz, D. A. Phys. Rev. Lett. 1995, 74, 1250-1253.
4. Castillo, H. E.; Chamon, C.; Cugliandolo, L. F.; Kennett, M. P. Phys. Rev. Lett. 2002, 88, 237201-237204.
5. Garrahan, J. P.; Chandler, D. Phys. Rev. Lett. 2002, 89, 035704.
6. Terris, B. D.; Stern, J. E.; Rugar, D.; Mamin, H. J. Phys. Rev. Lett. 1989, 63, 2669-2672.
7. Walther, L. E.; Israeloff, N. E.; Vidal Russell, E.; Alvarez Gomariz, H. Phys. Rev. B: Condens. Matter Mater. Phys. 1998, 57, R15112-R15115.