Body bias voltage computations for process and temperature compensation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 16, Issue 3, 2008, Pages 249-262

  Kumar, Sanjay V ^b   Kim, Chris H ^b   Sapatnekar, Sachin S ^a,b  

^a IEEE

^b University of Minnesota   (United States)

Author keywords

Adaptive body bias (ABB); Circuit optimization; Delay; Leakage; Process variations; Temperature variations

Indexed keywords

ADAPTIVE SYSTEMS; BIAS VOLTAGE; LEAKAGE CURRENTS; VLSI CIRCUITS;

ADAPTIVE BODY BIAS (ABB); CIRCUIT DESIGNERS; TEMPERATURE COMPENSATION;

COMPUTATION THEORY;

EID: 39749184704     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.912137     Document Type: Article

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