Larger-than-Vdd forward body bias in sub-0.5V nanoscale CMOS

Proceedings of the 2004 International Symposium on Lower Power Electronics and Design, ISLPED'04

Volumn , Issue , 2004, Pages 8-13

  Ananthan, Hari ^a   Kim, Chris H ^a   Roy, Kaushik ^a  

^a Purdue University   (United States)

Author keywords

Forward Body Bias; Junction Leakage; Process Variations; Sub threshold Leakage

Indexed keywords

HIGH TEMPERATURE OPERATIONS; LEAKAGE CURRENTS; LOGIC DESIGN; MOSFET DEVICES; POWER ELECTRONICS; THRESHOLD VOLTAGE;

FORWARD BODY BIAS (FBB); JUNCTION LEAKAGE; PROCESS VARIATIONS; SUB-THRESHOLD LEAKAGE;

CMOS INTEGRATED CIRCUITS;

EID: 16244401645     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1013235.1013244     Document Type: Conference Paper

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