Deformation of amorphous silicon nanostructures subjected to monotonic and cyclic loading

Journal of Materials Research

Volumn 23, Issue 2, 2008, Pages 328-335

  Gaire, C ^a   Ye, D X ^a   Lu, T M ^a   Wang, G C ^a   Picu, R C ^b  

^a Research Rensselaer Polytechnic Institute   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL GEOMETRY; CYCLIC LOADS; DEFORMATION; FATIGUE TESTING; FINITE ELEMENT METHOD; NANOSTRUCTURES;

FORCE-DISPLACEMENT RESPONSE; MONOTONIC LOADING; PROGRESSIVE DAMAGE ACCUMULATION;

AMORPHOUS SILICON;

EID: 39749159639     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2008.0061     Document Type: Article

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