Al-oxynitride interfacial layer investigations for PrXO Y on SiC and Si

Journal of Physics: Conference Series

Volumn 94, Issue 1, 2008, Pages

  Henkel, K ^a   Karavaev, K ^a   Torche, M ^a   Schwiertz, C ^a   Burkov, Y ^a   Schmeisser D ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38949188236     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/94/1/012004     Document Type: Article

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