Si(0 0 1) surface oxidation by N2O

Journal of Non-Crystalline Solids

Volumn 303, Issue 1, 2002, Pages 6-11

  Hoffmann, P ^a   Mikalo, R P ^a   Schmeisser D ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; FILM GROWTH; MORPHOLOGY; NITROGEN OXIDES; OXIDATION; PHASE DIAGRAMS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PRESSURE EFFECTS; SURFACE REACTIONS; SYNCHROTRON RADIATION; ULTRATHIN FILMS;

PHOTOEMISSION ELECTRON MICROSCOPY (PEEM);

SEMICONDUCTING SILICON;

EID: 0036567717     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)00956-0     Document Type: Article

References (10)