Fault tolerant structures for nanoscale gates

2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings

Volumn , Issue , 2007, Pages 605-610

  Martorell, Ferran ^a   Cotofana, Sorin D ^b   Rubio, Antonio ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Averaging cell; Complexity estimation; Defect tolerance; Fault tolerance; NAND multiplexing

Indexed keywords

CHLORINE COMPOUNDS; NANOELECTRONICS; NANOSTRUCTURED MATERIALS; NETWORKS (CIRCUITS); OPTICAL DESIGN; PROBABILITY; TECHNOLOGY; TELECOMMUNICATION;

AREA COST; AVERAGING CELL; BASED GATES; CIRCUIT RELIABILITY; COMPLEXITY ESTIMATION; DEFECT TOLERANCE; DEVICE RELIABILITY; ERROR PROBABILITIES; FAULT TOLERANCE; FAULT-TOLERANT; FAULT-TOLERANT STRUCTURES; INTERNATIONAL CONFERENCES; NAND MULTIPLEXING; NANO DEVICES; NANO SCALING; NANOTECHNOLOGIES; POSSIBLE SOLUTIONS; REDUNDANT DESIGN;

NANOTECHNOLOGY;

EID: 38149060015     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2007.4601264     Document Type: Conference Paper

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