CONAN - A design exploration framework for reliable nano-electronics architectures

Proceedings of the International Conference on Application-Specific Systems, Architectures and Processors

Volumn , Issue , 2005, Pages 260-267

  Cotofana, S ^a   Schmid, A ^b   Leblebici, Y ^b   Ionescu, A ^b   Soffke, O ^c   Zipf, P ^c   Glesner, M ^c   Rubio, A ^d  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b EPFL   (Switzerland)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; ELECTRIC POWER UTILIZATION; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; RELIABILITY;

CELL LEVELS; COMPUTATION CELLS; INTERCONNECT REROUTING; NANO-DEVICES;

NANOTECHNOLOGY;

EID: 24944438414     PISSN: 10636862     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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