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Volumn 22, Issue 4, 1999, Pages 319-323

Sources and control of volatile gases hazardous to hermetic electronic enclosures

Author keywords

[No Author keywords available]

Indexed keywords

GAS HAZARDS; MICROELECTRONICS;

EID: 0033337691     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.816102     Document Type: Article
Times cited : (10)

References (20)
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    • Koelmans, H.1
  • 3
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    • The identification and elimination of human contamination in the manufacture of IC's
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    • R. W. Thomas and D. W. Calabrese, "The identification and elimination of human contamination in the manufacture of IC's," in Proc. Int. Rel. Phys. Symp. (IRPS), Mar. 1985, pp. 228-234.
    • (1985) Proc. Int. Rel. Phys. Symp. (IRPS) , pp. 228-234
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  • 4
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    • Moisture in semiconductor packages
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    • R. W. Thomas and D. E. Meyer, "Moisture in semiconductor packages," Solid State Technol., vol. 17, no. 9, pp. 65-68, Sept. 1974.
    • (1974) Solid State Technol. , vol.17 , Issue.9 , pp. 65-68
    • Thomas, R.W.1    Meyer, D.E.2
  • 5
    • 0020256904 scopus 로고
    • Water vapor measurements in small volumes using atmospheric pressure chemical ionization-mass spectrometry
    • Mar.
    • R. M. Stimac, M. J. Cohen, and R. F. Wernlund, "Water vapor measurements in small volumes using atmospheric pressure chemical ionization-mass spectrometry," in Proc. IRPS, Mar. 1982, pp. 260-263.
    • (1982) Proc. IRPS , pp. 260-263
    • Stimac, R.M.1    Cohen, M.J.2    Wernlund, R.F.3
  • 6
    • 0018720288 scopus 로고
    • Characteristics of a surface conductivity moisture monitor for hermetic integrated circuit packages
    • Apr.
    • R. K. Lowry, L. A. Miller, A. W. Jonas, and J. M. Bird, "Characteristics of a surface conductivity moisture monitor for hermetic integrated circuit packages," in Proc. IRPS, Apr. 1979, pp. 97-102.
    • (1979) Proc. IRPS , pp. 97-102
    • Lowry, R.K.1    Miller, L.A.2    Jonas, A.W.3    Bird, J.M.4
  • 7
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    • Using the die of an integrated circuit to measure the relative humidity inside its encapsulation
    • Nov.
    • R. P. Merrett, "Using the die of an integrated circuit to measure the relative humidity inside its encapsulation," in Proc. IRPS, Nov. 1980, pp. 17-25.
    • (1980) Proc. IRPS , pp. 17-25
    • Merrett, R.P.1
  • 8
    • 33749905892 scopus 로고
    • A new moisture sensor for in situ monitoring of sealed packages
    • Apr.
    • M. G. Kovac, D. Chleck, and P. Goodman, "A new moisture sensor for in situ monitoring of sealed packages," in Proc. IRPS, Apr. 1977, pp. 102-107.
    • (1977) Proc. IRPS , pp. 102-107
    • Kovac, M.G.1    Chleck, D.2    Goodman, P.3
  • 9
    • 0019282168 scopus 로고
    • 3 in situ monitoring chips for cerdip package applications
    • Apr.
    • 3 in situ monitoring chips for cerdip package applications," in Proc. IRPS, Apr. 1980, pp. 10-16.
    • (1980) Proc. IRPS , pp. 10-16
    • Finn, J.B.1    Fong, V.2
  • 10
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    • Dynamic measurement of the water vapor content of integrated circuit packages using derivative infrared diode laser spectroscopy
    • Mar.
    • P. R. Bossard and J. A. Mucha, "Dynamic measurement of the water vapor content of integrated circuit packages using derivative infrared diode laser spectroscopy," in Proc. IRPS. Mar. 1982, pp. 260-263.
    • (1982) Proc. IRPS. , pp. 260-263
    • Bossard, P.R.1    Mucha, J.A.2
  • 14
    • 33749944910 scopus 로고
    • "Thermal fatigue lead-soldered semiconductor device," U.S. Patent 3735208, Aug.
    • A. E. Roswell and G. K. Clymer, "Thermal fatigue lead-soldered semiconductor device," U.S. Patent 3735208, Aug. 1971.
    • (1971)
    • Roswell, A.E.1    Clymer, G.K.2
  • 15
    • 33749958334 scopus 로고    scopus 로고
    • MIL-PRF-19500K, Para. D.3.9.2.d
    • MIL-PRF-19500K, Para. D.3.9.2.d.
  • 18
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    • Effects of silicon nitride encapsulation on MOS device stability
    • Apr.
    • R. C. Sun, J. T. Clemens, and J. T. Nelson, "Effects of silicon nitride encapsulation on MOS device stability," in Proc. IRPS, Apr. 1980, pp. 244-251.
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    • Sun, R.C.1    Clemens, J.T.2    Nelson, J.T.3
  • 19
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    • R. K. Lowry, "A hermetic package internal water vapor paradox: Nonconforming product that does not fail," in Proc. Int. Symp. Testing Failure Anal. (ISTFA). Nov. 1998, pp. 175-178.
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    • Lowry, R.K.1
  • 20
    • 0023384229 scopus 로고
    • Analysis of human contaminants pinpoints sources of IC defects
    • July
    • R. K. Lowry, J. H. Linn, G. M. Grove, and C. A. Vicroy, "Analysis of human contaminants pinpoints sources of IC defects," Semicond. Int., July 1987, pp. 73-77.
    • (1987) Semicond. Int. , pp. 73-77
    • Lowry, R.K.1    Linn, J.H.2    Grove, G.M.3    Vicroy, C.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.