Fourier transform photoabsorption spectroscopy based on scanning tunneling microscopy

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Naruse, Nobuyasu ^a   Mera, Yutaka ^b   Fukuzawa, Yo ^b   Nakamura, Yoshiaki ^b   Ichikawa, Masakazu ^b   Maeda, Koji ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; INTERFEROMETERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SPECTRUM ANALYSIS;

FOURIER TRANSFORM PHOTOABSORPTION SPECTROSCOPY; PHOTOABSORPTION SPECTRUM;

SPECTROSCOPIC ANALYSIS;

EID: 37149009245     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817956     Document Type: Article

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