Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic imaging semiconductor surfaces

Ultramicroscopy

Volumn 107, Issue 8, 2007, Pages 568-574

  Naruse, Nobuyasu ^a,b   Mera, Yutaka ^a,b   Hayashida, Yukinobu ^a   Maeda, Koji ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Au; Photo modulated STM; Si; Surface photovoltage

Indexed keywords

FREQUENCY MODULATION; GOLD; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; SURFACE PHENOMENA;

CURRENT SIGNALS; PHOTOMODULATED STM; RESPONSE ANALYSIS; SURFACE PHOTOVOLTAGE;

PHOTOCURRENTS;

AMPLITUDE MODULATION; ARTICLE; CONTRAST; ILLUMINATION; MEMBRANE CURRENT; PHOTOCHEMISTRY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SIGNAL TRANSDUCTION; SURFACE PROPERTY;

EID: 34247171675     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.11.004     Document Type: Article

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