STM nanospectroscopic study of defects in semiconductors

Materials Research Society Symposium - Proceedings

Volumn 719, Issue , 2002, Pages 153-158

  Maeda, Koji ^a   Hida, Akira ^a   Mera, Yutaka ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; SPECTROSCOPIC ANALYSIS;

LIGHT ILLUMINATION;

CRYSTAL DEFECTS;

EID: 0036458392     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-719-f6.2     Document Type: Conference Paper

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