Nanometer-scale measurements of photoabsorption spectra of individual defects in semiconductors

Applied Physics Letters

Volumn 78, Issue 21, 2001, Pages 3190-3192

  Hida, Akira ^a   Mera, Yutaka ^a   Maeda, Koji ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035926949     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1371960     Document Type: Article

References (13)

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